CORE CRYSTAL SEMICONDUCTOR TECHNOLOGIES

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Small Area Sample Probing

CR-LEPS-007-SSP-MPR100EC

Small Area Sample Probing

Small Area Sample Probing

CR-LEPS-007-SSP-MPR100EC

Category: Sample Probing Boards

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  • Small Sample Probes
  • Gold coated probing pins
  • Spring loaded pogo pin touch (<1mm spot)
  • Suitable design for multible probing 
  • Total 20 probing points (+1 optional back contact)
  • Optional gold wiring and fingers
  • Mountable on any other surface with 4 screw holes
  • Over all PCB board Diameter 100mm circle

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